|
AFWAL
|
Air Force Wright Aeronautical
Laboratory
|
|
AFWL
|
Air Force Weapons Laboratory
|
|
AR
|
antireflectance
|
|
AU
|
astronomical units
|
|
BER
|
bit error loss
|
|
CERT
|
Centre d'Etudes et de Recherches de
Toulouse
|
|
CFRP
|
carbon-fiber-reinforced
plastic
|
|
CHPC
|
dicyclohexyl peroxydicarbonate
|
|
CNES
|
Centre National d'Etudes
Spatiales
|
|
CNRS
|
Centre National de la Recherche
Scientiflque
|
|
CST
|
Centre Spatial de Toulouse
|
|
CVCHP
|
cascade variable conductance heat
pipe
|
|
DERTS
|
Direction d'Etudes et de Recherches
et Techniques Spatiales
|
|
DFVLR
|
Deutsche Forschungs und
Versuchsanstalt fur Luhft- und Raumfahrt
|
|
DOD
|
Department of Defense
|
|
DOP
|
di-octyl phthalate
|
|
EAROM
|
erasable read-only memory
|
|
EECC
|
experiment exposure control
canister
|
|
EMI
|
electromagnetic interference
|
|
EMP
|
electromagnetic pulse
|
|
EPDS
|
experiment power and data
system
|
|
ESCA
|
electron spectroscopy for chemical
analyses
|
|
ESTEC
|
European Space Research and
Technology Center
|
|
EUV
|
extreme ultraviolet
|
|
FRECOPA
|
French cooperative payload
|
|
HEPP
|
heat pipe experiment package
|
|
IITRI
|
Illinois institute of Technology
Research institute
|
|
IR
|
infrared
|
|
JSC
|
Johnson Space Center
|
|
KSC
|
Kennedy Space Center
|
|
LDEF
|
Long Duration Exposure
Facility
|
|
LED
|
light-emitting diode
|
|
LPSP
|
Laboratoire de Physique Stellaire et
Planetaire
|
|
MBB
|
Messerschmitt-Bolkow-Blohm
GmbH
|
|
MOS
|
metal oxide silicon
|
|
OCLI
|
Optical Coating Laboratory,
Inc.
|
|
ONERA
|
Offce National d'Etudes et de
Recherches Aerospatiales
|
|
OSR
|
optical surface reflection
|
|
PCM
|
phase change material
|
|
PIN
|
refers to structure of device
|
|
QCM
|
quartz crystal microbalance
|
|
RMS
|
remote manipulator system
|
|
SAA
|
South Atlantic anomaly
|
|
SEM
|
scanning electron microscopy
|
|
SGEMP
|
system-generated electromagnetic
pulse
|
|
SH
|
superheavy
|
|
SIMS
|
secondary ion mass
spectroscopy
|
|
STS
|
Space Transportation System
|
|
TLD
|
thermoluminescent dosimeter
|
|
TEM
|
transmission electron
microscopy
|
